Name
Abstract | ||
|---|---|---|
Flexible hybrid electronics (FHE) systems are an emerging technology that can be used in various applications such as automotive systems, energy harvesting, wireless transmission, and wearable electronics. However, due to wear and tear from stretching and twisting of the flexible substrate, interconnect designed onto flexible substrates are subject to loss of performance and failure. Therefore it becomes imperative to design low cost test coupons for flexible substrate interconnect that can be used to detect and diagnose interconnect failure due to onset of mechanical stress. In this paper, a monobit built-in test and diagnosis system for flexible electronic interconnect is introduced and verified in simulation. Methods for in-situ monitoring, signal reconstruction, impedance change detection and diagnosis are introduced. The proposed monobit architecture and associated algorithms achieve efficient test and diagnostics without the use of complex electronics such as needed for time-domain reflectometry (TDR). |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/ATS.2018.00044 | 2018 IEEE 27th Asian Test Symposium (ATS) |
Keywords | Field | DocType |
Flexible hybrid electronics,impedance discontinuity,monobit receiver,built-in test,in-run diagnostics | Wear and tear,Computer science,Energy harvesting,Electronic engineering,Electrical impedance,Electronics,Reflectometry,Interconnection,Wearable technology,Signal reconstruction | Conference |
ISSN | ISBN | Citations |
1081-7735 | 978-1-5386-9467-1 | 0 |
PageRank | References | Authors |
0.34 | 3 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jun-Yang Lei | 1 | 0 | 0.34 |
| Thomas Moon | 2 | 15 | 3.75 |
| Justin Chow | 3 | 1 | 0.77 |
| Suresh K. Sitaraman | 4 | 25 | 5.53 |
| Abhijit Chatterjee | 5 | 1949 | 269.99 |