Abstract | ||
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This paper reports on a content addressable memory (CAM) employing a multi-Vdd scheme for low power pattern recognition applications. The complete design, simulation and testing of the chip is presented along with an exploration of the multi-Vdd design space. The proposed design, operating at an optimal operating point in a triple-Vdd configuration, increases the delay range by 2.4 times and consumes 25.3% less power when compared to a conventional single-Vdd design operating over the same voltage range. Measurement results from a 246 kb test chip fabricated in 130nm Global Foundries Low Power CMOS technology are presented to validate the model and analysis. |
Year | DOI | Venue |
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2017 | 10.1109/MWSCAS.2017.8052945 | Midwest Symposium on Circuits and Systems Conference Proceedings |
Keywords | Field | DocType |
Content addressable memory (CAM),TCAM,multi Vdd,multi supply,low power,associative memory,tunable operation | Design space,Content-addressable memory,Propagation delay,Computer science,Operating point,Voltage,Electronic engineering,Chip,CMOS,Power demand | Conference |
ISSN | Citations | PageRank |
1548-3746 | 0 | 0.34 |
References | Authors | |
6 | 9 |
Name | Order | Citations | PageRank |
---|---|---|---|
Siddhartha Joshi | 1 | 2 | 2.10 |
Dawei Li | 2 | 7 | 2.23 |
Seda Ogrenci Memik | 3 | 0 | 0.68 |
G. Deptuch | 4 | 0 | 1.35 |
James Hoff | 5 | 2 | 1.09 |
Sergo Jindariani | 6 | 17 | 2.36 |
Tiehui Liu | 7 | 2 | 0.75 |
Jamieson Olsen | 8 | 2 | 0.75 |
Nhan Tran | 9 | 18 | 6.08 |