Name
Abstract | ||
|---|---|---|
Logic built-in self-test (LBIST) is now increasingly used with on-chip test compression as a complementary solution for in-system test, where high quality, low power, low silicon area, and most importantly short test application time are key factors affecting ICs targeted for safety-critical systems. Test points, common in LBIST-ready designs, can help to reduce test time and the overall silicon o... |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/TCAD.2018.2834441 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | Field | DocType |
Circuit faults,Built-in self-test,System-on-chip,Silicon,Clocks,Safety | Computer science,Electronic engineering,Computer hardware | Journal |
Volume | Issue | ISSN |
38 | 6 | 0278-0070 |
Citations | PageRank | References |
3 | 0.39 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Elham Moghaddam | 1 | 79 | 7.05 |
| Nilanjan Mukherjee | 2 | 801 | 57.26 |
| Janusz Rajski | 3 | 2460 | 201.28 |
| Jĕdrzej Solecki | 4 | 28 | 4.07 |
| Jerzy Tyszer | 5 | 838 | 74.98 |
| Justyna Zawada | 6 | 20 | 3.48 |