Name
Abstract | ||
|---|---|---|
Temperature effect inversion (TEI) phenomenon in ultralow power (ULP) very large scale integration circuits has been identified as an important effect by both academia and industry. Although a number of ULP methods that attempt to exploit the TEI phenomenon have been proposed, the small size of the design exploration space when applying these methods to ULP circuits hinders them from achieving the... |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/TCAD.2018.2859240 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | Field | DocType |
Space exploration,Transistors,Very large scale integration,Delays,Aerospace electronics,Low-power electronics,Voltage control | Computer science,Voltage,Electronic engineering,Frequency scaling,Granularity,Transistor,Electronic circuit,Scaling,Very-large-scale integration,Low-power electronics | Journal |
Volume | Issue | ISSN |
38 | 9 | 0278-0070 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Woojoo Lee | 1 | 104 | 10.96 |
| taewook kang | 2 | 9 | 4.06 |
| Jae-Jin Lee | 3 | 27 | 8.69 |
| Kyuseung Han | 4 | 58 | 7.86 |
| Joongheon Kim | 5 | 611 | 81.49 |
| Massoud Pedram | 6 | 7801 | 1211.32 |