Name
Year | DOI | Venue |
|---|---|---|
1999 | 10.1145/307418.307539 | DATE '99 Proceedings of the conference on Design, automation and test in Europe |
Keywords | DocType | ISBN |
automatic test pattern generation,fault coverage,automatic test equipment,logic,frequency,hardware,cross talk,chip,ground bounce,dft,testability,design for testability,fault model | Conference | 1-58113-121-6 |
Citations | PageRank | References |
7 | 0.90 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| M. Nicolaidis | 1 | 281 | 31.66 |
| Y. Zorian | 2 | 499 | 47.97 |