Abstract | ||
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A methodology for determining the substrate profile for accurate prediction of parasitics using Green's function based substrate extractors is presented. The technique requires fabrication of only a few test structures and results in an accurate three layered approximation. The substrate resistances are accurate to within 10% of measurements. This methodology can be used along with a scalable macromodel for a qualitative pre-design and pre-layout estimation of the digital switching noise that couples though the substrate to sensitive analog/RF circuits. |
Year | DOI | Venue |
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2004 | 10.1109/ISCAS.2004.1329484 | 2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 5, PROCEEDINGS |
Keywords | Field | DocType |
green function,fabrication,analog circuits,rf circuits,radio frequency,calibration,testing | Discrete circuit,Computer science,Circuit extraction,Circuit design,Substrate coupling,Electronic engineering,Electronic circuit,Parasitic extraction,Equivalent circuit,Calibration | Conference |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
6 |
Name | Order | Citations | PageRank |
---|---|---|---|
Ajit Sharma | 1 | 34 | 6.71 |
Chenggang Xu | 2 | 15 | 4.34 |
wen kung chu | 3 | 9 | 2.16 |
Nishath K. Verghese | 4 | 58 | 10.58 |
Terri S. Fiez | 5 | 167 | 47.25 |
Kartikeya Mayaram | 6 | 349 | 58.50 |