Name
Abstract | ||
|---|---|---|
Fault diagnosis methods for specified fault models might deduce wrong faults as suspicious candidate faults (misprediction). The methods might not be able to also deduce suspicious candidate faults (non-prediction). In this paper, a fault diagnosis method for a single universal logical fault model in scan testing is proposed. In the fault diagnosis method, a diagnostic fault simulation for a single universal logical fault model is used. The number of mispredictions, the number of non-predictions, the number of suspicious candidate faults, and fault diagnosis time are evaluated compared with a fault diagnosis method for a single stuck-at fault model. Experimental results show the effectiveness of our proposed method. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/PRDC.2017.38 | 2017 IEEE 22nd Pacific Rim International Symposium on Dependable Computing (PRDC) |
Keywords | Field | DocType |
fault diagnosis,universal logical fault model,multicycle capture testing,diagnostic fault simulation | Stuck-at fault,Sequential logic,Fault coverage,Computer science,Real-time computing,Fault (power engineering),Fault model,Reliability engineering,Fault indicator | Conference |
ISSN | ISBN | Citations |
1555-094X | 978-1-5090-5653-8 | 0 |
PageRank | References | Authors |
0.34 | 6 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Toshinori Hosokawa | 1 | 84 | 16.12 |
| Hideyuki Takano | 2 | 0 | 0.34 |
| Hiroshi Yamazaki | 3 | 7 | 3.28 |
| Koji Yamazaki | 4 | 27 | 8.41 |