Name
Title | ||
|---|---|---|
Radiation sensitivity of XOR topologies in multigate technologies under voltage variability |
Abstract | ||
|---|---|---|
Integrated Circuits are becoming more susceptible to numerous effects due to the reduction of its robustness to external noise. Additionally, the increase of uncertainty degree related to the many sources of variation in the manufacturing process contributes to the reliability issues. This work is aimed at presenting a comparative analysis of radiation sensitivity of different XOR implementations using two multigate devices: double-gate FinFET and Trigate. Trigate-based circuits have shown to be more robust than FinFET with improvement percentage from 6,2% up to 12,6% in the threshold LET. Further, voltage fluctuation can reduce the threshold LET up to 20,8%, increasing the susceptibility of the analyzed circuits. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/LASCAS.2017.7948075 | 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS) |
Keywords | Field | DocType |
Radiation Sensitivity,FinFET,Trigate,XOR logic gate,Voltage Variability | Logic gate,Radiation sensitivity,Computer science,Voltage,Electronic engineering,Robustness (computer science),Network topology,Electronic circuit,Integrated circuit,Threshold voltage | Conference |
ISBN | Citations | PageRank |
978-1-5090-5860-0 | 1 | 0.42 |
References | Authors | |
3 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ygor Q. de Aguiar | 1 | 1 | 0.42 |
| Cristina Meinhardt | 2 | 21 | 13.35 |
| Ricardo A. L. Reis | 3 | 217 | 48.75 |