Title
Bit-flip detection-driven selection of trace signals.
Abstract
Since integrating memory blocks on-chip became affordable, embedded logic analysis has been used extensively for post-silicon validation and debugging. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed as an algorithmic problem a decade ago. The primary focus of the subsequent approaches on this topic was to restore as much data as possible within a so...
Year
DOI
Venue
2018
10.1109/TCAD.2017.2729458
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Keywords
DocType
Volume
Debugging,Computer bugs,Clocks,Logic gates,System-on-chip,Design automation
Journal
37
Issue
ISSN
Citations 
5
0278-0070
0
PageRank 
References 
Authors
0.34
8
2
Name
Order
Citations
PageRank
Amin Vali110.71
Nicola Nicolici280759.91