Name
Abstract | ||
|---|---|---|
The sustained increase in storage density and simultaneous cost reductions of NAND flash memories have ensured their continued popularity. But these positive attributes are linked to less desirable trends such as a reduction in the reliability of memory cells, requiring an increasingly overwhelming amount of sophisticated mitigation techniques, which become most apparent when applied to enterprise-level storage systems. |
Year | Venue | Field |
|---|---|---|
2018 | ERCIM NEWS | Enterprise storage,Computer security,Computer science,NAND gate,Operating system |
DocType | Volume | Issue |
Journal | 2018 | 113 |
ISSN | Citations | PageRank |
0926-4981 | 0 | 0.34 |
References | Authors | |
0 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Roman Pletka | 1 | 229 | 15.23 |
| N. Ioannou | 2 | 18 | 3.77 |
| Nikolaos Papandreou | 3 | 251 | 28.18 |
| Thomas P. Parnell | 4 | 34 | 3.97 |
| Sasa Tomic | 5 | 18 | 2.98 |