Title
Energy and Reliability Improvement of Voltage-Based, Clustered, Coarse-Grain Reconfigurable Architectures by Employing Quality-Aware Mapping.
Abstract
An energy-quality scalable coarse grain reconfigurable architecture (CGRA) based on the voltage overscaling (VOS) technique is presented. The approximation level of each processing element (PE) in the CGRA is determined by the applied VOS-determined voltage level. By employing the technique, the architecture may be configured for accurate or approximate modes of computation depending on a user-spe...
Year
DOI
Venue
2018
10.1109/JETCAS.2018.2856838
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
Keywords
Field
DocType
Hardware,Delays,Aging,Threshold voltage,Reconfigurable architectures,Fitting
Graph,Computer science,Voltage,Electronic engineering,Computational science,Dataflow,Processing element,Energy consumption,Threshold voltage,Computation,Scalability
Journal
Volume
Issue
ISSN
8
3
2156-3357
Citations 
PageRank 
References 
3
0.45
0
Authors
4
Name
Order
Citations
PageRank
Hassan Afzali-Kusha173.21
Omid Akbari2323.35
Mehdi Kamal318930.41
Massoud Pedram478011211.32