Title | ||
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Energy and Reliability Improvement of Voltage-Based, Clustered, Coarse-Grain Reconfigurable Architectures by Employing Quality-Aware Mapping. |
Abstract | ||
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An energy-quality scalable coarse grain reconfigurable architecture (CGRA) based on the voltage overscaling (VOS) technique is presented. The approximation level of each processing element (PE) in the CGRA is determined by the applied VOS-determined voltage level. By employing the technique, the architecture may be configured for accurate or approximate modes of computation depending on a user-spe... |
Year | DOI | Venue |
---|---|---|
2018 | 10.1109/JETCAS.2018.2856838 | IEEE Journal on Emerging and Selected Topics in Circuits and Systems |
Keywords | Field | DocType |
Hardware,Delays,Aging,Threshold voltage,Reconfigurable architectures,Fitting | Graph,Computer science,Voltage,Electronic engineering,Computational science,Dataflow,Processing element,Energy consumption,Threshold voltage,Computation,Scalability | Journal |
Volume | Issue | ISSN |
8 | 3 | 2156-3357 |
Citations | PageRank | References |
3 | 0.45 | 0 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Hassan Afzali-Kusha | 1 | 7 | 3.21 |
Omid Akbari | 2 | 32 | 3.35 |
Mehdi Kamal | 3 | 189 | 30.41 |
Massoud Pedram | 4 | 7801 | 1211.32 |