Title
Voltage-Controlled Magnetoelectric Memory Bit-cell Design With Assisted Body-bias in FD-SOI
Abstract
Voltage-controlled magnetic anisotropy (VCMA)-magnetic tunnel junction (MTJ) is incorporated into FD-SOI CMOS technology. The design space of 1 transistor-1 MTJ (1T-1M) bit-cell is explored through varied VCMA pulse duration/amplitude and scaling down transistor dimensions. The design point with 1.1 V VCMA pulse amplitude, 0.44 ns pulse duration and W/L = 400 nm/30 nm access transistor shows the ultra low write energy in VCMA-MTJ based bit-cell. It achieves a minimum 3.18 fJ/bit switching energy with 28-nm FD-SOI process. Access transistor sizing is studied, while the ultra low power implementation may lead to MTJ switching failure. Voltage assisted techniques for failure mitigation are proposed based on body-bias generator (BBG). The BBG not only provides VCMA pulse signal to control MTJ barrier, but also generates body-bias to boost the transistor performance. In the presence of forward body-bias (FBB) and increased VCMA pulse level, the proposed strategy is effective in switching failure compensation as well as writing delay improvement.
Year
DOI
Venue
2019
10.1145/3299874.3317982
Proceedings of the 2019 on Great Lakes Symposium on VLSI
Keywords
Field
DocType
design boundary, fd-soi, ultra-low power, vcma-mtj, voltage assisted techniques
Silicon on insulator,Computer science,Voltage,Tunnel junction,Electronic engineering,CMOS,Pulse duration,Transistor,Optoelectronics,Pulse-amplitude modulation,Bit cell
Conference
ISSN
ISBN
Citations 
1066-1395
978-1-4503-6252-8
0
PageRank 
References 
Authors
0.34
0
7
Name
Order
Citations
PageRank
Hao Cai1115.27
Menglin Han232.43
Weiwei Shan32212.51
Jun Yang414736.54
You Wang5299.66
Wang Kang616127.54
Weisheng Zhao7730105.43