Title
Corrigendum to "Scaling equations for the accurate prediction of CMOS device performance from 180 nm to 7 nm" [Integr. VLSI J. 58. (2017) 74-81].
Year
DOI
Venue
2019
10.1016/j.vlsi.2019.04.006
Integration
DocType
Volume
ISSN
Journal
67
0167-9260
Citations 
PageRank 
References 
0
0.34
0
Authors
2
Name
Order
Citations
PageRank
Aaron Stillmaker1615.12
Bevan M. Baas229527.78