Title
Test-Friendly Data-Selectable Self-Gating (DSSG)
Abstract
Low-power design is a key consideration in modern design. XOR self-gating (data-driven self-gating) is used for power reduction in clock networks, which is one of the main factors of dynamic power consumption. When applying XOR self-gating, dynamic power consumption is reduced, but the number of required test patterns on the testing side is inflated. In critical cases, more than three times the regular number of scan test patterns may be required for industrial designs, such as GPUs. In this brief, we propose a novel self-gating structure. Data-selectable self-gating (DSSG) is designed to use functional data and scan data selectively to eliminate the unnecessary clock toggling of flip-flops. With this structure, the self-gating function can be used in the scan test mode, as well as the function mode. When the self-gating logic is used during scan shift operations, the stuck-at faults in the self-gating logic can be tested with short test sequences; therefore, the rise in test costs can be mitigated. It is possible to test the stuck-at faults in self-gating logic using only four scan test patterns. The experimental results show that the average of the stuck-at test pattern increase ratio has been dropped from more than 90% to less than 8%. The low-power performance of the proposed method in the mission mode is the same as that of the conventional self-gating structures. When the DSSG method is used, the dynamic power of the shift operation which may increase excessively during the scan test can be reduced.
Year
DOI
Keywords
2019
10.1109/TVLSI.2019.2916637
Circuit faults,Clocks,Power demand,Logic gates,Very large scale integration,Automatic test pattern generation
Field
DocType
Volume
Automatic test pattern generation,Logic gate,Gating,Computer science,Regular number,Electronic engineering,Power demand,Dynamic demand,Computer hardware,Very-large-scale integration
Journal
27
Issue
ISSN
Citations 
8
1063-8210
0
PageRank 
References 
Authors
0.34
0
3
Name
Order
Citations
PageRank
Jihye Kim112.04
Sangjun Lee2146.67
Sungho Kang343678.44