Paper Info
Title
An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks
Abstract
This paper presents an integrated circuit (IC) array whose purpose is to observe, quantify and characterize the impact of time-dependent variability effects, like aging, in several widely used digital and analog circuit blocks. With the increasing interest that this kind of mechanism has attracted in the last years, for its potential impact in the reliability of ultra-scaled integrated circuits, it is only relevant that appropriate measures are taken to find out how it can be included (and thus mitigated) in the design process of such integrated circuits. And, while substantial literature exists that covers the device level, time-dependent variability at circuit level has not been as equally studied. This work complements our previous efforts in providing a holistic approach to Reliability-Aware Design: from statistical characterization and modeling at device-level, to simulation, and into optimization-based design with reliability considerations, the array presented here provides one more step towards a thorough and accurate understanding of how time-dependent variability works at the circuit level.
Year
DOI
Venue
2019
10.1109/SMACD.2019.8795277
2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
Keywords
Field
DocType
Time-Dependent Variability,Aging,Bias Temperature Instability,Hot Carrier Injection,Random Telegraph Noise,Analog Circuits
Analogue electronics,Computer science,Hot-carrier injection,Electronic engineering,Engineering design process,Integrated circuit
Conference
ISSN
ISBN
Citations 
2575-4874
978-1-7281-1202-2
1
PageRank 
References 
Authors
0.48
0
8
Name
Order
Citations
PageRank
P. Martín-Lloret1154.01
J. Nuñez210.82
Elisenda Roca312926.84
Rafael Castro-López411.16
Javier Martín-Martínez511.16
Rosana Rodríguez611.16
Montserrat Nafría711.16
Francisco V. Fernández811.50