Name
Title | ||
|---|---|---|
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level |
Abstract | ||
|---|---|---|
Time-Dependent Variability has attracted increasing interest in the last years. In particular, time-dependent phenomena such as Bias Temperature Instability, Hot Carrier Injection and Random Telegraph Noise can have a large impact on circuit reliability, and must be therefore characterized and modeled. For technologies in the nanometer range, these phenomena reveal a stochastic behavior and must be characterized in a massive manner, with enormous amounts of data being generated in each measurement. In this work, a novel tool with a user-friendly interface, which allows the robust and fully-automated parameter extraction for RTN, BTI and HCI experiments, is presented. |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/SMACD.2019.8795245 | 2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) |
Keywords | Field | DocType |
TDV,BTI,HCI,RTN,analysis,tool | Robust analysis,Temperature instability,Stochastic behavior,Computer science,Toolbox,Circuit reliability,Hot-carrier injection,Electronic engineering,Transistor | Conference |
ISSN | ISBN | Citations |
2575-4874 | 978-1-7281-1202-2 | 0 |
PageRank | References | Authors |
0.34 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| P. Saraza-Canflanca | 1 | 1 | 1.79 |
| Javier Diaz-Fortuny | 2 | 0 | 1.01 |
| R. Castro-López | 3 | 0 | 0.34 |
| Elisenda Roca | 4 | 129 | 26.84 |
| Javier Martín-Martínez | 5 | 1 | 1.16 |
| Rosana Rodríguez | 6 | 1 | 1.16 |
| Montserrat Nafría | 7 | 1 | 1.16 |
| Francisco V. Fernández | 8 | 1 | 1.50 |