Name
Title | ||
|---|---|---|
Backside Thermal Fault Localization Using Laser Scanning Confocal Thermoreflectance Microscopy Based on Auto-Balanced Detection |
Abstract | ||
|---|---|---|
In this paper, we propose a sensitivity-enhanced thermoreflectance microscopy (TRM) system employing an electronic auto-balancing photoreceiver for effective thermal fault localization through a Si substrate. The proposed system in the auto-balanced detection not only improves the system signal-to-noise ratio (SNR) by approximately five times compared to that achievable via normal detection but al... |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/TIM.2019.2925248 | IEEE Transactions on Instrumentation and Measurement |
Keywords | DocType | Volume |
Laser beams,Circuit faults,Measurement by laser beam,Substrates,Imaging,Silicon,Transmission line measurements | Journal | 69 |
Issue | ISSN | Citations |
6 | 0018-9456 | 0 |
PageRank | References | Authors |
0.34 | 0 | 10 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dong-Uk Kim | 1 | 9 | 2.31 |
| Jung Dae Kim | 2 | 0 | 0.68 |
| Ilkyu Han | 3 | 0 | 0.34 |
| Chan Bae Jeong | 4 | 0 | 0.68 |
| Kye-Sung Lee | 5 | 1 | 2.17 |
| Hwan Hur | 6 | 1 | 1.16 |
| Ki-Hwan Nam | 7 | 2 | 1.78 |
| Ji Yong Bae | 8 | 0 | 0.34 |
| I Jong Kim | 9 | 0 | 0.34 |
| Ki Soo Chang | 10 | 1 | 1.50 |