Author Info
Name
Affiliation
Papers
CHAN BAE JEONG
Korea Basic Sci Inst, Div Sci Instrumentat, 169-148 Gwahak Ro, Daejeon 34133, South Korea
2
Collaborators
Citations 
PageRank 
11
0
0.68
Referers 
Referees 
References 
0
8
2
Title
Citations
PageRank
Year
Backside Thermal Fault Localization Using Laser Scanning Confocal Thermoreflectance Microscopy Based on Auto-Balanced Detection00.342020
Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices.00.342017