Title
A Margin Adjustable Amplifier Circuit for RRAM Read Access
Abstract
In order to solve the problems of delay and crosstalk in RRAM read process, a sense amplifier (SA) circuits with adjustable margin for RRAM read access is designed. The circuit includes delay circuit, sense preamplifier circuit, and read circuit. Based on the characteristics of differential signal on bitline of RRAM during read access, a carefully controlled timing sequence is designed in the new Sense Amplifier (SA) circuit. With the help of a 4-1 delay circuit, the SA can adjust the pre-amplification of differential voltage between bitlines and improve the reliability of read access. The simulation results show that the scheme can successfully identify the high resistance state and low resistance state of the memory cell and output “0” or “1”, solving the problems of delay and crosstalk in read process.
Year
DOI
Venue
2019
10.1109/ICICDT.2019.8790865
2019 International Conference on IC Design and Technology (ICICDT)
Keywords
Field
DocType
RRAM,delay,sense amplifier,read process
Sense amplifier,Preamplifier,Electronic engineering,Resistor,Non-volatile memory,Engineering,Electronic circuit,Resistive random-access memory,Amplifier,Memory cell
Conference
ISSN
ISBN
Citations 
2381-3555
978-1-7281-1854-3
0
PageRank 
References 
Authors
0.34
6
4
Name
Order
Citations
PageRank
Jinchen Liu100.34
Ziou Wang200.34
Yiping Zhang321.09
Lijun Zhang424537.10