Name
Abstract | ||
|---|---|---|
State-of-the-art analog-to-digital converter (ADC) built-in self-test (BIST) methods relax the test stimulus linearity but require a constant voltage shift during testing. A low-cost on-chip BIST solution with a modified R2R digital-to-analog converter (DAC) structure is developed as a signal generator and a voltage shift generator for ADC linearity test. The proposed DAC is a subradix-2 R2R DAC w... |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/TIM.2019.2936716 | IEEE Transactions on Instrumentation and Measurement |
Keywords | DocType | Volume |
Signal generators,Built-in self-test,Signal resolution,Linearity,Histograms,Mathematical model | Journal | 69 |
Issue | ISSN | Citations |
6 | 0018-9456 | 0 |
PageRank | References | Authors |
0.34 | 0 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tao Chen | 1 | 68 | 11.76 |
| Chul-Hyun Park | 2 | 150 | 12.36 |
| Hao Meng | 3 | 0 | 0.34 |
| Dadian Zhou | 4 | 0 | 0.34 |
| Jose Silva-Martinez | 5 | 630 | 86.56 |
| Randall L. Geiger | 6 | 384 | 68.09 |
| Degang Chen | 7 | 121 | 26.13 |