Title
2-Mb Embedded Phase Change Memory With 16-ns Read Access Time and 5-Mb/s Write Throughput in 90-nm BCD Technology for Automotive Applications
Abstract
This letter presents a 2-Mb embedded phase change memory (ePCM) macrocell designed in 90-nm BJT-CMOS-DMOS (BCD) technology able to address the next generation of automotive and smart-power products exploiting an ePCM cell based on a Ge-rich chalcogenide alloy. The optimized memory allows 16-ns random access time and 5-Mbit/s write throughput from −40 °C to 175 °C, with 100 kcycle endurance. The sense amplifier, the programming circuitry, and the data processing logic able to meet automotive requirements are described. The silicon results are provided.
Year
DOI
Venue
2019
10.1109/ESSCIRC.2019.8902656
ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference (ESSCIRC)
Keywords
DocType
ISSN
Automotive applications,embedded memory,germanium-rich alloy,nonvolatile memory,phase change memory,smart power devices
Conference
1930-8833
ISBN
Citations 
PageRank 
978-1-7281-1551-1
3
0.58
References 
Authors
2
22