Title
A Fast Method for Modeling and Optimizing Parasitic Light Sensitivity in Global Shutter CMOS Image Sensors
Abstract
This paper aims to model Parasitic Light Sensitivity (PLS) in Global Shutter CMOS Image Sensors (GS-CIS) through separation of the optical problem from the carriers motion one, reducing required simulation. Finite-Differences Time-Domain (FDTD) simulations are used to solve the optical problem, while photo-generated carriers motion is modeled as a straight line, with limited influence of the local electric field. Though not showing perfect agreement with experimental data, the model can be used for analyzing the influence of some key parameters on PLS for GS-CIS optimization.
Year
DOI
Venue
2019
10.1109/ESSDERC.2019.8901750
ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)
Field
DocType
ISSN
Line (geometry),Optical Problem,Electric field,Experimental data,Image sensor,Shutter,Electronic engineering,CMOS,Finite-difference time-domain method,Materials science
Conference
1930-8876
ISBN
Citations 
PageRank 
978-1-7281-1540-5
0
0.34
References 
Authors
2
7