Title | ||
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FinFET Variability and Near-threshold operation - Impact on Full Adders design using XOR Blocks. |
Abstract | ||
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Near threshold operation reaches good results to energy critical applications. However, it introduces a considerable degradation on delay. Moreover, considering nano-effects, circuits operating at near-threshold are more sensitive to process variability. This paper analysis 9 full adders built with internal blocks that contain different combinations of 3 XOR logic circuits operating with nominal and near-threshold voltages under process variability effects. The experiments adopt the 7nm FinFET ASAP technology. The near-threshold operation can reduce on 97% the maximum power consumption and 65% the total energy, with an impact of about 10 times on delay. Considering process variability impact on energy and delay, the near-threshold operation turns the circuits about 1.6 and 4 times more sensitive in the critical cases, respectively. Compared with traditional full adders, the proposed circuits can improve around 15% of the delay with similar power results. The results provide valuable data and show how the impact of variability and near-threshold operation are important factors that must be analyzed to design more robust and low power circuits. |
Year | DOI | Venue |
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2019 | 10.1109/ICECS46596.2019.8965022 | ICECS |
Field | DocType | Citations |
Adder,Computer science,Microelectronics,Multigate device,Voltage,XOR gate,Electronic engineering,Electronic circuit,Maximum power principle,Process variability | Conference | 0 |
PageRank | References | Authors |
0.34 | 0 | 3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Fabio G. Rossato G. da Silva | 1 | 0 | 0.34 |
Cristina Meinhardt | 2 | 21 | 13.35 |
Ricardo A. L. Reis | 3 | 217 | 48.75 |