Paper Info
Title
Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs
Abstract
Carbon-nanotube FETs (CNFETs) are potential successors to CMOS transistors; these emerging devices have a low intrinsic delay due to near-ballistic transport in carbon nanotubes (CNTs). As CNFETs are evaluated for circuit/system design, it is important to analyze variations in CNT process parameters. In this article, we present a systematic approach to quantify the impact of these imperfections on...
Year
DOI
Venue
2020
10.1109/TVLSI.2020.2976734
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Keywords
DocType
Volume
CNTFETs,Logic gates,Integrated circuit modeling,Manufacturing,Substrates,Ions
Journal
28
Issue
ISSN
Citations 
6
1063-8210
0
PageRank 
References 
Authors
0.34
0
3
Name
Order
Citations
PageRank
Sanmitra Banerjee194.68
Arjun Chaudhuri2177.07
K Chakrabarty38173636.14