| Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits | 0 | 0.34 | 2021 |
| Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin ∗ | 3 | 0.48 | 2021 |
| Fault-Criticality Assessment for AI Accelerators using Graph Convolutional Networks. | 0 | 0.34 | 2021 |
| Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits* | 1 | 0.36 | 2021 |
| ParaMitE: Mitigating Parasitic CNFETs in the Presence of Unetched CNTs | 0 | 0.34 | 2021 |
| Analysis of the Impact of Process Variations and Manufacturing Defects on the Performance of Carbon-Nanotube FETs | 0 | 0.34 | 2020 |
| Advances in Design and Test of Monolithic 3-D ICs | 1 | 0.38 | 2020 |
| Functional Criticality Classification of Structural Faults in AI Accelerators | 4 | 0.49 | 2020 |
| NodeRank: Observation-Point Insertion for Fault Localization in Monolithic 3D ICs | 2 | 0.39 | 2020 |
| C-Testing of AI Accelerators | 1 | 0.39 | 2020 |
| RTL-to-GDS design tools for monolithic 3D ICs | 0 | 0.34 | 2020 |
| Hardware Fault Tolerance for Binary RRAM Crossbars | 1 | 0.43 | 2019 |
| Compact Scalable Dynamic TSV IR Drop Compensation for Power Delivery in 3D Packages | 0 | 0.34 | 2019 |
| Built-in Self-Test for Inter-Layer Vias in Monolithic 3D ICs | 1 | 0.36 | 2019 |
| RTL-to-GDS Tool Flow and Design-for-Test Solutions for Monolithic 3D ICs | 1 | 0.36 | 2019 |
| Fault-Tolerant Neuromorphic Computing Systems | 0 | 0.34 | 2019 |
| Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors | 2 | 0.39 | 2018 |
| Single Chip Self-Tunable N-Input N-Output PID Control System with Integrated Analog Front-end for Miniature Robotics. | 0 | 0.34 | 2017 |
| Selective De-noising of Sparse-Coloured Images. | 0 | 0.34 | 2016 |
