Name
Title | ||
|---|---|---|
Applicative System Level Test introduction to Increase Confidence on Screening Quality |
Abstract | ||
|---|---|---|
The introduction of System Level Test (SLT) about a decade ago aimed to a better sustainability for the achievement of the quality objectives required by high performances GPUs and CPUs. The paper intends giving some quantitative information to support this simplified statement. To do this we will report the results of a study conducted by the industrial application of SLT on a product targeted to a high-quality market segment, such as automotive. The discussion will describe the different SLT solutions developed for this new field of application and how it was possible to isolate SLT-only fails and relative functional root causes and cross-correlate traditional ATE test versus SLT screening capability through manufacturing operations. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/DDECS50862.2020.9095569 | 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
Keywords | DocType | ISSN |
System Level Test,automotive electronics,quality,unique fails isolation | Conference | 2334-3133 |
ISBN | Citations | PageRank |
978-1-7281-9939-9 | 0 | 0.34 |
References | Authors | |
8 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Paolo Bernardi | 1 | 244 | 30.63 |
| Marco Restifo | 2 | 6 | 3.31 |
| Matteo Sonza Reorda | 3 | 1250 | 136.66 |
| Davide Appello | 4 | 37 | 8.48 |
| C. Bertani | 5 | 0 | 0.34 |
| D. Petrali | 6 | 0 | 0.34 |