Name
Abstract | ||
|---|---|---|
In this paper, we propose a defect-oriented Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/MS) Integrated Circuits (ICs), called symmetry-based BIST (Sym-BIST). SymBIST exploits inherent symmetries into the design to generate invariances that should hold true only in defect-free operation. Violation of any of these invariances points to defect detection. We demonstrate SymBIST on a 65nm 10-bit Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC) IP by ST Microelectronics. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.23919/DATE48585.2020.9116189 | 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Keywords | DocType | ISSN |
SAR ADC IP,Self-Test paradigm,SymBIST,defect-free operation,Analog-to-Digital Converter IP,symmetry-based A-M-S BIST,ST Microelectronics,successive approximation register,analog-mixed-signal integrated circuits,A-MS integrated circuits,defect detection,size 65.0 nm | Conference | 1530-1591 |
ISBN | Citations | PageRank |
978-1-7281-4468-9 | 0 | 0.34 |
References | Authors | |
0 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Antonios Pavlidis | 1 | 2 | 2.09 |
| Marie-Minerve Louerat | 2 | 23 | 6.46 |
| Eric Faehn | 3 | 0 | 1.01 |
| Anand Kumar | 4 | 0 | 0.68 |
| Haralampos-G. D. Stratigopoulos | 5 | 252 | 28.06 |