Name
Abstract | ||
|---|---|---|
As the use of electronic components grows rapidly in the automotive industry, the number of complex safety-critical devices used in advanced driver assistance systems or autonomous cars is rising with high-end models containing more than 200 embedded microcontrollers. Achieving functionally safe automotive electronics requires test solutions that address challenges posed by high quality and long-term reliability requirements mandated, for example, by the ISO 26262 standard. The paper presents test pattern generation schemes for a scan-based logic BIST optimizing test coverage and test time during in-system test applications for automotive ICs. As a part of overall safety, they help in ensuring reliable operations of vehicle's electronics throughout their lifecycles. The proposed schemes can be deployed in different modes of in-system testing, including key-off, key-on, and periodic (incremental) online tests. Experimental results obtained for automotive designs and reported herein show improvements in test quality over conventional logic BIST schemes. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/ETS48528.2020.9131585 | 2020 IEEE European Test Symposium (ETS) |
Keywords | DocType | ISSN |
embedded-test,logic built-in self-test,LFSR reseeding,scan-based testing,test application time,test points | Conference | 1530-1877 |
ISBN | Citations | PageRank |
978-1-7281-4312-5 | 1 | 0.35 |
References | Authors | |
0 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bartosz Kaczmarek | 1 | 1 | 0.35 |
| Grzegorz Mrugalski | 2 | 501 | 35.90 |
| Nilanjan Mukherjee | 3 | 801 | 57.26 |
| Janusz Rajski | 4 | 2460 | 201.28 |
| Łukasz Rybak | 5 | 1 | 0.35 |
| Jerzy Tyszer | 6 | 838 | 74.98 |