Name
Abstract | ||
|---|---|---|
Probabilistic circuits are a potential solution for low power designs which trade off correctness for power consumption. The behavior of probabilistic circuits are more complicated than deterministic circuits because the former produce different outputs given the same inputs. We need to apply test pattern many times to obtain output distribution of probabilistic circuits. In this paper, we apply multivariate hypothesis testing to reduce pattern repetition. We also reduce overkill by tomographic testing to determine pass or fail of CUT. Experimental results show that our proposed technique can reduce pattern repetition by 82% and reduce overkill by 99%. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/ITC-Asia51099.2020.00026 | 2020 IEEE International Test Conference in Asia (ITC-Asia) |
Keywords | DocType | ISBN |
Probabilistic Circuits,Test Pattern Compression | Conference | 978-1-7281-8944-4 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ming-Ting Lee | 1 | 0 | 0.34 |
| Chen-Hung Wu | 2 | 0 | 1.35 |
| Shi-Tang Liu | 3 | 0 | 0.34 |
| Cheng-Yun Hsieh | 4 | 0 | 1.01 |
| James Chien-Mo Li | 5 | 187 | 27.16 |