Name
Abstract | ||
|---|---|---|
Electromagnetic fault injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only a little information on how EMFI generates faults. Within this context, this article aims at filling this lack by proposing a complete understanding and modeling of EM induction on integrated circuits (ICs). The presented model is confronted to experiments to endorse its soundness. |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/TCAD.2020.3003287 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | DocType | Volume |
Electromagnetic transients,fault diagnosis,integrated circuit reliability,modeling,security | Journal | 40 |
Issue | ISSN | Citations |
4 | 0278-0070 | 1 |
PageRank | References | Authors |
0.37 | 0 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| M. Dumont | 1 | 1 | 0.37 |
| M. Lisart | 2 | 1 | 0.37 |
| Philippe Maurine | 3 | 276 | 40.44 |