Name
Papers
Collaborators
PHILIPPE MAURINE
81
129
Citations 
PageRank 
Referers 
276
40.44
683
Referees 
References 
766
642
Search Limit
100766
Title
Citations
PageRank
Year
Fit The Joint Moments.00.342022
Modeling and Simulating Electromagnetic Fault Injection10.372021
Protecting Secure ICs Against Side-Channel Attacks by Identifying and Quantifying Potential EM and Leakage Hotspots at Simulation Stage00.342021
Revisiting Mutual Information Analysis: Multidimensionality, Neural Estimation and Optimality Proofs.00.342021
Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault Injection.30.502020
Leakage Assessment Through Neural Estimation of the Mutual Information.00.342020
Breaking Mobile Firmware Encryption through Near-Field Side-Channel Analysis00.342019
Editorial00.342019
Electromagnetic Fault Injection : How Faults Occur10.362019
From theory to practice: horizontal attacks on protected implementations of modular exponentiations00.342019
From theory to practice: horizontal attacks on protected implementations of modular exponentiations00.342019
Electromagnetic Activity vs. Logical Activity - Near Field Scans for Reverse Engineering.00.342018
Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.10.362018
Exploiting Phase Information in Thermal Scans for Stealthy Trojan Detection00.342018
The Impact of Pulsed Electromagnetic Fault Injection on True Random Number Generators10.352018
Estimating the Signal-to-Noise Ratio Under Repeated Sampling of the Same Centered Signal: Applications to Side-Channel Attacks on a Cryptoprocessor.00.342018
An EM Fault Injection Susceptibility Criterion and Its Application to the Localization of Hotspots.00.342017
Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation00.342017
Importance of IR drops on the modeling of laser-induced transient faults00.342017
Method for evaluation of transient-fault detection techniques.10.362017
An On-Chip Technique to Detect Hardware Trojans and Assist Counterfeit Identification.40.402017
Mutual information analysis: higher-order statistical moments, efficiency and efficacy.00.342017
Electromagnetic fault injection: the curse of flip-flops.40.442017
A fully-digital EM pulse detector00.342016
An Embedded Digital Sensor against EM and BB Fault Injection20.462016
On-chip fingerprinting of IC topology for integrity verification.00.342016
Interest of MIA in frequency domain?00.342015
Collision for Estimating SCA Measurement Quality and Related Applications.20.372015
Extraction of intrinsic structure for Hardware Trojan detection.00.342015
Collision Based Attacks in Practice30.412015
Vertical and horizontal correlation attacks on RNS-based exponentiations10.352015
EM Injection: Fault Model and Locality.80.632015
Thoroughly analyzing the use of ring oscillators for on-chip hardware trojan detection00.342015
Attacking Randomized Exponentiations Using Unsupervised Learning50.492014
Analysis Of Variance and CPA in SCA.10.352014
Evidence of a Larger EM-Induced Fault Model.100.652014
A model of the leakage in the frequency domain and its application to CPA and DPA.70.462014
On Adaptive Bandwidth Selection For Efficient Mia30.392014
Practical Analysis of RSA Countermeasures Against Side-Channel Electromagnetic Attacks.20.372013
A Frequency Leakage Model and its application to CPA and DPA.00.342013
Electromagnetic Analysis on RSA Algorithm Based on RNS50.442013
An evaluation of an AES implementation protected against EM analysis20.372013
Countermeasures Against Em Analysis For A Secured Fpga-Based Aes Implementation30.432013
Amplitude demodulation-based EM analysis of different RSA implementations30.402012
Delay-correlation-aware SSTA based on conditional moments10.482012
Magnitude Squared Coherence based SCA.10.362012
Injection of transient faults using electromagnetic pulses -Practical results on a cryptographic system-.110.952012
Embedding statistical tests for on-chip dynamic voltage and temperature monitoring120.712012
SCA with magnitude squared coherence20.382012
Statistical timing characterization00.342012
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