Abstract | ||
---|---|---|
FPGA that exploits via-switches, which are a kind of non-volatile resistive RAMs, for crossbar implementation is attracting attention due to its high integration density and energy efficiency. Via-switch crossbar is responsible for the signal routing in the interconnections by changing on/off-states of via-switches. To verify the via-switch crossbar functionality after manufacturing, fault testing that checks whether we can turn on/off via-switches normally is essential. This paper confirms that a general differential pair comparator successfully discriminates on/off-states of via-switches, and clarifies fault modes of a via-switch by transistor-level SPICE simulation that injects stuck-on/off faults to atom switch and varistor, where a via-switch consists of two atom switches and two varistors. We then propose a fault diagnosis methodology for via-switches in the crossbar that diagnoses the fault modes according to the comparator response difference between the normal and faulty via-switches. The proposed method achieves 100% fault detection by checking the comparator responses after turning on/off the via-switch. In case that the number of faulty components in a via-switch is one, the ratio of the fault diagnosis, which exactly identifies the faulty varistor and atom switch inside the faulty via-switch, is 100%, and in case of up to two faults, the fault diagnosis ratio is 79%. |
Year | DOI | Venue |
---|---|---|
2020 | 10.1587/transfun.2020VLP0005 | IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES |
Keywords | DocType | Volume |
via-switch, non-volatile FPGA, crossbar, fault diagnosis | Journal | E103A |
Issue | ISSN | Citations |
12 | 0916-8508 | 0 |
PageRank | References | Authors |
0.34 | 0 | 4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Ryutaro Doi | 1 | 6 | 3.31 |
Xu Bai | 2 | 37 | 9.94 |
Toshitsugu Sakamoto | 3 | 42 | 11.66 |
Masanori Hashimoto | 4 | 0 | 0.34 |