Paper Info
Title
Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults
Abstract
The use of both broadside (launch-on-capture) and skewed-load (launch-on-shift) tests for delay faults results in increased delay fault coverage and better test compaction than the use of a single test type. Two-cycle broadside and skewed-load tests differ in the sequence of length two applied to the scan-enable input between the scan-in and scan-out operations of a test. Considering a circuit with a single clock domain, the question that this article attempts to answer is whether it is possible to generate a complete test set for transition faults where all the tests use the same scan-enable sequence of length three or more. The use of a single scan-enable sequence simplifies the test application process. Experimental results demonstrate that there is a significant number of benchmark circuits for which a test set with a single scan-enable sequence achieves the same transition fault coverage as a test set that consists of both broadside and skewed-load tests. For other benchmark circuits, a small loss in transition fault coverage compared with the use of both test types allows a single scan-enable sequence to be used.
Year
DOI
Venue
2021
10.1109/TVLSI.2020.3038368
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Keywords
DocType
Volume
Broadside tests,full-scan circuits,multicycle tests,skewed-load tests,test generation,transition faults
Journal
29
Issue
ISSN
Citations 
2
1063-8210
0
PageRank 
References 
Authors
0.34
0
2
Name
Order
Citations
PageRank
I. Pomeranz11265105.92
Xijiang Lin268742.03