Name
Abstract | ||
|---|---|---|
Scan chains are the fundamental building blocks for DFT, and testing for scan integrity is the first step in a robust test methodology. This article describes scan integrity tests for embedded test compression structures. |
Year | DOI | Venue |
|---|---|---|
2020 | 10.1109/MDAT.2020.2968271 | IEEE Design & Test |
Keywords | DocType | Volume |
scan integrity tests,EDT compression,scan chains,fundamental building blocks,robust test methodology,embedded test compression structures | Journal | 37 |
Issue | ISSN | Citations |
4 | 2168-2356 | 0 |
PageRank | References | Authors |
0.34 | 0 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Wu-tung Cheng | 1 | 1350 | 121.45 |
| Grzegorz Mrugalski | 2 | 501 | 35.90 |
| Janusz Rajski | 3 | 2460 | 201.28 |
| Maciej Trawka | 4 | 0 | 0.34 |
| Jerzy Tyszer | 5 | 838 | 74.98 |