Title
Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization
Abstract
Aging-induced degradation imposes a major challenge to the designer when estimating timing guardbands. This problem increases as traditional worst-case corners bring over-pessimism to designers, exacerbating competitive and close-to-the-edge designs. In this work, we present an accurate machine learning approach for aging-aware cell library characterization, enabling the designer to evaluate their...
Year
DOI
Venue
2021
10.1109/TCSI.2021.3069664
IEEE Transactions on Circuits and Systems I: Regular Papers
Keywords
DocType
Volume
Libraries,Aging,Delays,Foundries,Tools,Degradation,Reliability
Journal
68
Issue
ISSN
Citations 
6
1549-8328
2
PageRank 
References 
Authors
0.48
0
2
Name
Order
Citations
PageRank
Florian Klemme192.39
Hussam Amrouch225150.22