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| Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization | 0 | 0.34 | 2022 |
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| Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency | 1 | 0.36 | 2022 |
| Software-Managed Read and Write Wear-Leveling for Non-Volatile Main Memory | 1 | 0.35 | 2022 |
| Advanced Thermal Management using Approximate Computing and On-Chip Thermoelectric Cooling | 0 | 0.34 | 2022 |
| Real-Time Full-Chip Thermal Tracking: A Post-Silicon, Machine Learning Perspective | 0 | 0.34 | 2022 |
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| MLCAD: A Survey of Research in Machine Learning for CAD Keynote Paper | 0 | 0.34 | 2022 |
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| Intelligent Methods for Test and Reliability | 0 | 0.34 | 2022 |
| Cross-layer FeFET Reliability Modeling for Robust Hyperdimensional Computing | 0 | 0.34 | 2022 |
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| Brain-Inspired Computing for Wafer Map Defect Pattern Classification | 3 | 0.43 | 2021 |
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| Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization | 2 | 0.48 | 2021 |
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| On-demand Mobile CPU Cooling with Thin-Film Thermoelectric Array | 1 | 0.36 | 2021 |
| Machine Learning for Circuit Aging Estimation under Workload Dependency | 1 | 0.44 | 2021 |
| Cross-layer Design for Computing-in-Memory: From Devices, Circuits, to Architectures and Applications | 0 | 0.34 | 2021 |
| Transistor Self-Heating: The Rising Challenge for Semiconductor Testing | 1 | 0.36 | 2021 |
| ICCAD Tutorial Session Paper Ferroelectric FET Technology and Applications: From Devices to Systems | 0 | 0.34 | 2021 |
| Approximate Computing for ML: State-of-the-art, Challenges and Visions | 2 | 0.41 | 2021 |
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| Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses | 0 | 0.34 | 2021 |
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| FeFET and NCFET for Future Neural Networks: Visions and Opportunities | 0 | 0.34 | 2021 |
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| Control Variate Approximation for DNN Accelerators | 2 | 0.37 | 2021 |
| Modeling emerging technologies using machine learning: challenges and opportunities | 1 | 0.34 | 2020 |
| Impact of NBTI Aging on Self-Heating in Nanowire FET. | 0 | 0.34 | 2020 |
| Dynamic Power and Energy Management for NCFET-Based Processors | 0 | 0.34 | 2020 |
| Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology | 1 | 0.36 | 2020 |
| Power Side-Channel Attacks in Negative Capacitance Transistor | 1 | 0.38 | 2020 |
