Name
Abstract | ||
|---|---|---|
With the introduction of FinFET transistors, the Self-Heating Effect (SHE) became a major reliability challenge. In this work, we present an automated SHE estimation method integrated within a circuit reliability framework. It allows designers to study SHE in analogue and digital circuits. For accurate analysis, we employ electrically and thermally calibrated 14nm FinFET transistor models. To demo... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/VLSI-DAT52063.2021.9427356 | 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) |
Keywords | DocType | ISSN |
Logic gates,Very large scale integration,Tools,FinFETs,Delays,Topology,Thermal analysis | Conference | 2474-2724 |
ISBN | Citations | PageRank |
978-1-6654-1915-4 | 0 | 0.34 |
References | Authors | |
0 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Victor M. van Santen | 1 | 0 | 0.68 |
| Linda Schillinger | 2 | 0 | 0.34 |
| Hussam Amrouch | 3 | 251 | 50.22 |