Name
Abstract | ||
|---|---|---|
With technology scaling approaching atomic levels, IC test and diagnosis of complex System-on-Chips (SoCs) become overwhelming challenging. In addition, sustaining the reliability of transistors as well as circuits at such extreme feature sizes, for the entire projected lifetime, also become profoundly difficult. This holds even more when it comes to emerging technologies that go beyond convection... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/VTS50974.2021.9441052 | 2021 IEEE 39th VLSI Test Symposium (VTS) |
Keywords | DocType | ISSN |
Degradation,Neural networks,Machine learning,Very large scale integration,System-on-chip,Transistors,Integrated circuit reliability | Conference | 1093-0167 |
ISBN | Citations | PageRank |
978-1-6654-1949-9 | 0 | 0.34 |
References | Authors | |
0 | 10 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hussam Amrouch | 1 | 251 | 50.22 |
| Animesh Basak Chowdhury | 2 | 0 | 0.34 |
| Wentian Jin | 3 | 1 | 2.37 |
| Ramesh Karri | 4 | 2968 | 224.90 |
| Farshad Khorrami | 5 | 2 | 1.04 |
| Prashanth Krishnamurthy | 6 | 2 | 1.71 |
| Ilia Polian | 7 | 889 | 78.66 |
| Victor M. van Santen | 8 | 0 | 0.68 |
| Benjamin Tan | 9 | 5 | 3.58 |
| Xiang-Dong Tan | 10 | 177 | 30.26 |