Name
Abstract | ||
|---|---|---|
Fault diagnosis methodologies for analog circuits lag far behind those for their digital counterparts. In this paper, we show how the generic Symmetry-based Built-In Self-Test (BIST) (or SymBIST), originally proposed for defect-oriented post-manufacturing test and on-line test, can be seamlessly reused for the purpose of diagnosis. BIST can offer better insights into the circuit and, thereby, can ... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ETS50041.2021.9465386 | 2021 IEEE European Test Symposium (ETS) |
DocType | ISSN | ISBN |
Conference | 1530-1877 | 978-1-6654-1849-2 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Antonios Pavlidis | 1 | 2 | 2.09 |
| Eric Faehn | 2 | 0 | 1.01 |
| Marie-Minerve Louerat | 3 | 23 | 6.46 |
| Haralampos-G. D. Stratigopoulos | 4 | 252 | 28.06 |