Name
Abstract | ||
|---|---|---|
STT-MRAM mass production is around the corner as major foundries worldwide invest heavily on its commercialization. To ensure high-quality STT-MRAM products, effective yet cost-efficient test solutions are of great importance. This article presents a systematic device-aware defect and fault modeling framework for STT-MRAM to derive accurate fault models which reflect the physical defects appropria... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/TETC.2019.2960375 | IEEE Transactions on Emerging Topics in Computing |
Keywords | DocType | Volume |
Magnetic tunneling,Switches,Resistors,Multiprotocol label switching,Magnetic anisotropy,Magnetization,Saturation magnetization | Journal | 9 |
Issue | ISSN | Citations |
2 | 2168-6750 | 1 |
PageRank | References | Authors |
0.36 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Lizhou Wu | 1 | 1 | 0.36 |
| Siddharth Rao | 2 | 11 | 2.23 |
| Mottaqiallah Taouil | 3 | 1 | 0.36 |
| Guilherme Cardoso Medeiros | 4 | 6 | 3.59 |
| Moritz Fieback | 5 | 8 | 3.03 |
| Erik Jan Marinissen | 6 | 1 | 0.36 |
| G. Kar | 7 | 9 | 6.91 |
| Said Hamdioui | 8 | 887 | 118.69 |