Name
Abstract | ||
|---|---|---|
The semiconductor industry ramping up design capabilities for emerging technologies is facing new test quality and yield management challenges. To facilitate debugging of the first silicon, diagnosis of yield issues, and to enable repair processes, an accurate defect isolation is needed with support of advanced test, diagnostic, and yield analysis tools. Laser voltage imaging (LVI), laser voltage ... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/TETC.2019.2944590 | IEEE Transactions on Emerging Topics in Computing |
Keywords | DocType | Volume |
Transistors,Failure analysis,Silicon,System-on-chip,Imaging,Clocks,Laser beams | Journal | 9 |
Issue | ISSN | Citations |
2 | 2168-6750 | 0 |
PageRank | References | Authors |
0.34 | 0 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Wu-Tung Cheng | 1 | 2 | 0.78 |
| Sylwester Milewski | 2 | 3 | 3.12 |
| Grzegorz Mrugalski | 3 | 0 | 0.34 |
| Janusz Rajski | 4 | 2460 | 201.28 |
| Maciej Trawka | 5 | 0 | 0.68 |
| Jerzy Tyszer | 6 | 838 | 74.98 |