Title
Diagnosis for IGBT Open-circuit Faults in Photovoltaic Inverters: A Compressed Sensing and CNN based Method
Abstract
The inverter is the most vulnerable module of photovoltaic (PV) systems. The insulated gate bipolar transistor (IGBT) is the core part of inverters and the root source of PV inverter failures. How to effectively diagnose the IGBT faults is critical for reliability, high efficiency, and safety of PV systems. Recently, deep learning (DL) methods are widely used for fault detection and diagnosis. Dif...
Year
DOI
Venue
2021
10.1109/INDIN45523.2021.9557384
2021 IEEE 19th International Conference on Industrial Informatics (INDIN)
Keywords
DocType
ISBN
Training,Insulated gate bipolar transistors,Photovoltaic systems,Deep learning,Fault detection,Feature extraction,Inverters
Conference
978-1-7281-4395-8
Citations 
PageRank 
References 
0
0.34
0
Authors
5
Name
Order
Citations
PageRank
Xinyi Wang100.34
Bo Yang236140.37
Qi Liu300.68
Jingzheng Tu400.34
Cai-Lian Chen583198.98