Name
Abstract | ||
|---|---|---|
This paper presents defect tolerance strategies for islandable-microgrid sensors both at the sensor level and at the matrix (or deployment) level. A microgrid is a group of interconnected distributed power/energy sources and loads with well-defined electrical boundaries that act as a single controllable entity with respect to the main grid or other micro-grids, and can connect or disconnect from t... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/DFT52944.2021.9568353 | 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
Keywords | DocType | ISSN |
Microgrid,islanding,sensors,estimation of key variables (frequency, phase and amplitude),defect and fault tolerance,yield and reliability improvement | Conference | 1550-5774 |
ISBN | Citations | PageRank |
978-1-6654-1609-2 | 0 | 0.34 |
References | Authors | |
0 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Vijay K. Jain | 1 | 93 | 54.61 |
| Glenn H. Chapman | 2 | 167 | 34.10 |