Name
Abstract | ||
|---|---|---|
With the rise of the use of CPU-based Systems on a Chip (SoCs) in critical applications, the need to comply with harsh environments such as radiations or environmental fluctuation of parameters where they will evolve is essential. Devices must be qualified using Accelerated Soft-Error Rate (ASER). They are irradiated with neutrons, heavy ions, protons, or alpha particles depending on the mission p... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/DFT52944.2021.9568317 | 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
Keywords | DocType | ISSN |
Particle beams,Silicon-on-insulator,Intellectual property,Neutrons,Software,Hardware,System-on-chip | Conference | 1550-5774 |
ISBN | Citations | PageRank |
978-1-6654-1609-2 | 0 | 0.34 |
References | Authors | |
0 | 8 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sébastien Thomet | 1 | 0 | 0.34 |
| Serge De-Paoli | 2 | 0 | 0.34 |
| J.M. Daveau | 3 | 17 | 3.12 |
| Valérie Bertin | 4 | 0 | 0.34 |
| Fady Abouzeid | 5 | 32 | 6.98 |
| Philippe Roche | 6 | 85 | 16.31 |
| Ghaffari Fakhreddine | 7 | 53 | 14.06 |
| Olivier Romain | 8 | 141 | 28.20 |