Name
Abstract | ||
|---|---|---|
Determining how Integrated circuits' (ICs) soft (transient) errors (also known as Single Event Upsets or SEUs) change with elevation is important in many applications, both on Earth and in aerospace. We have been studying SEUs using camera sensors, which record SEUs as bright spots in a dark image. The most important advantage of camera pixels for this study is that they integrate the information ... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/DFT52944.2021.9568337 | 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
DocType | ISSN | ISBN |
Conference | 1550-5774 | 978-1-6654-1609-2 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Glenn H. Chapman | 1 | 167 | 34.10 |
| Simone Neufeld | 2 | 0 | 0.34 |
| J. Klinsmann | 3 | 0 | 0.34 |
| Israel Koren | 4 | 0 | 0.34 |
| Zahava Koren | 5 | 0 | 0.34 |
| Coelho Silva Meneses | 6 | 0 | 0.34 |