Name
Abstract | ||
|---|---|---|
Due to the increasing size of integrated circuits (ICs), their design and optimization phases (i.e., computer-aided design, CAD) grow increasingly complex. At design time, a large design space needs to be explored to find an implementation that fulfills all specifications and then optimizes metrics like energy, area, delay, reliability, etc. At run time, a large configuration space needs to be searched to find the best set of parameters (e.g., voltage/frequency) to further optimize the system. Both spaces are infeasible for exhaustive search typically leading to heuristic optimization algorithms that find some tradeoff between design quality and computational overhead. Machine learning (ML) can build powerful models that have successfully been employed in related domains. In this survey, we categorize how ML may be used and is used for design-time and run-time optimization and exploration strategies of ICs. A metastudy of published techniques unveils areas in CAD that are well explored and underexplored with ML, as well as trends in the employed ML algorithms. We present a comprehensive categorization and summary of the state of the art on ML for CAD. Finally, we summarize the remaining challenges and promising open research directions. |
Year | DOI | Venue |
|---|---|---|
2022 | 10.1109/TCAD.2021.3124762 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | DocType | Volume |
Computer-aided design (CAD),deep learning,electronic design automation,machine learning (ML) | Journal | 41 |
Issue | ISSN | Citations |
10 | 0278-0070 | 0 |
PageRank | References | Authors |
0.34 | 75 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Martin Rapp | 1 | 6 | 4.83 |
| Hussam Amrouch | 2 | 251 | 50.22 |
| Yibo Lin | 3 | 0 | 0.34 |
| Bei Yu | 4 | 656 | 74.07 |
| David Z. Pan | 5 | 2653 | 237.64 |
| Marilyn Wolf | 6 | 114 | 31.09 |
| J. Henkel | 7 | 4471 | 366.50 |