Title
Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin ∗
Abstract
Owing to the inherent fault tolerance of deep neural network (DNN) models used for classification, many structural faults in the processing elements (PEs) of a systolic array-based AI accelerator are functionally benign. Brute-force fault simulation for determining fault criticality is computationally expensive due to many potential fault sites in the accelerator array and the dependence of critic...
Year
DOI
Venue
2021
10.1109/ITC50571.2021.00015
2021 IEEE International Test Conference (ITC)
DocType
ISSN
ISBN
Conference
1089-3539
978-1-6654-1695-5
Citations 
PageRank 
References 
3
0.48
0
Authors
6
Name
Order
Citations
PageRank
Arjun Chaudhuri1177.07
Ching-Yuan Chen231.83
Jonti Talukdar381.35
Siddarth Madala430.48
Abhishek Kumar Dubey530.48
K Chakrabarty68173636.14