Title
Brain-Inspired Computing for Wafer Map Defect Pattern Classification
Abstract
Brain-Inspired hyperdimensional computing is a quickly emerging alternative machine-learning concept. Hypervectors with thousands of dimensions represent real-world data. Thanks to this redundancy, the system becomes robust against noise in the input data, but also resilient against faults, similar to the human brain. The light-weight operations with hypervectors are fully parallelizable enabling ...
Year
DOI
Venue
2021
10.1109/ITC50571.2021.00020
2021 IEEE International Test Conference (ITC)
Keywords
DocType
ISSN
hyperdimensional computing,HDC,brain inspired,wafer map defect pattern,classification,wafer map,VSA
Conference
1089-3539
ISBN
Citations 
PageRank 
978-1-6654-1695-5
3
0.43
References 
Authors
0
2
Name
Order
Citations
PageRank
Paul R. Genssler130.43
Hussam Amrouch225150.22