Name
Abstract | ||
|---|---|---|
The demand for neuromorphic chips has skyrocketed in recent years. Thus, efficient manufacturing testing becomes an issue. Conventional testing cannot be applied because some neuromorphic chips do not have scan chains. However, traditional functional testing for neuromorphic chips suffers from long test length and low fault coverage. In this work, we propose a machine learning-based test pattern g... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ICCAD51958.2021.9643459 | 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD) |
Keywords | DocType | ISSN |
Design automation,Neuromorphics,Scalability,Neurons,Predictive models,Manufacturing,Test pattern generators | Conference | 1933-7760 |
ISBN | Citations | PageRank |
978-1-6654-4507-8 | 0 | 0.34 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hsiao-Yin Tseng | 1 | 0 | 0.34 |
| I-Wei Chiu | 2 | 0 | 0.34 |
| Mu-Ting Wu | 3 | 0 | 1.35 |
| James Chien-Mo Li | 4 | 187 | 27.16 |