Name
Abstract | ||
|---|---|---|
As the manufactural technologies are moving to deep sub-micron process, the defects inside the design library cells occur more often during manufacture. Cell-Aware Testing (CAT) had been proposed to improve the test quality on detecting the cell internal defects. In CAT, the analog simulator is used to simulate the cell input combinations exhaustively for every defect to identify all the cell inpu... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ATS52891.2021.00030 | 2021 IEEE 30th Asian Test Symposium (ATS) |
Keywords | DocType | ISSN |
cell aware test,library cell,test generation,cell modeling | Conference | 1081-7735 |
ISBN | Citations | PageRank |
978-1-6654-4051-6 | 0 | 0.34 |
References | Authors | |
0 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xijiang Lin | 1 | 687 | 42.03 |
| Wu-tung Cheng | 2 | 1350 | 121.45 |
| Takeo Kobayashi | 3 | 0 | 0.34 |
| Andreas Glowatz | 4 | 99 | 8.12 |